Ultrasensitive SERS Detection by Defect Engineering on Single Cu2O Superstructure Particle
Ultrasensitive SERS Detection by Defect Engineering on Single Cu2O Superstructure Particle
复制标题
通过缺陷工程对单个 Cu2O 超结构颗粒进行超灵敏 SERS 检测
DOI：
10.1002/adma.201604797
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发表时间：
2017-02-02
影响因子：
29.4
通讯作者：
Guo, Lin
中科院分区：
文献类型：
--
作者：
Lin, Jie;Shang, Yang;Guo, Lin
Cu2O超结构是通过再结晶诱导的自组装策略构建的。由于空位缺陷促进的电荷转移过程和铜空位缺陷诱导的静电吸附的协同作用，单个Cu2O超结构颗粒表现出出色的表面增强拉曼光谱性能，检测限低至10-9 mol L-1，增强因子可与金属相当（8×105）。
A Cu2 O superstructure is constructed through a recrystallization-induced self-assembly strategy. Single Cu2 O superstructure particle exhibits an outstanding surface-enhanced Raman spectroscopy performance with the limit of detection as low as 10-9 mol L-1 and metal comparable enhancement factor (8 × 105 ) due to the synergetic effect of vacancies defect-facilitated charge-transfer process and copper vacancies defect-induced electrostatic adsorption.