Investigation of Interfacial Water Accumulation between Polypropylene Thin Film and Si Substrate by Neutron Reflectivity
Investigation of Interfacial Water Accumulation between Polypropylene Thin Film and Si Substrate by Neutron Reflectivity
复制标题
中子反射率研究聚丙烯薄膜与硅基片之间的界面积水
DOI：
10.1021/acs.langmuir.1c02771
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发表时间：
2021
期刊：
影响因子：
3.9
通讯作者：
Miyazaki Tsukasa
中科院分区：
文献类型：
--
作者：
Shimokita Keisuke;Yamamoto Katsuhiro;Miyata Noboru;Nakanishi Yohei;Ogawa Hiroki;Takenaka Mikihito;Yamada Norifumi L.;Miyazaki Tsukasa
我们进行了中子反射率（NR）测量的全同立构聚丙烯（PP）薄膜沉积在硅基板上的饱和蒸汽压的氘水，以调查界面之间的水积累PP基聚合物/无机填料纳米复合材料和金属/树脂粘接材料的PP和金属表面。通过旋涂技术在Si衬底上制备的PP薄膜足以作为这些材料中PP/金属界面的模型系统。一个富水层的最大水浓度为0.5，这是相当高的比那些在以前的研究中报道的有机/无机界面，观察到在饱和蒸汽条件下的界面处的宽度约为3 nm内。这可能归因于PP薄膜与Si衬底之间的弱相互作用。水分传输到界面区域的路径是沿着界面而不是通过PP膜，因为疏水PP薄膜不完全被水蒸气溶胀。
We performed neutron reflectivity (NR) measurements of isotactic polypropylene (PP) thin films deposited on a Si substrate at the saturated vapor pressure of deuterated water to investigate interfacial water accumulation between the PP and metal surfaces in PP-based polymer/inorganic filler nanocomposites and metal/resin bonding materials. The PP thin films prepared on a Si substrate by a spin-coating technique were adequate as a model system for the PP/metal interface in these materials. A water-rich layer with a maximum water concentration of 0.5, which was considerably higher than those reported in previous studies of organic/inorganic interfaces, was observed within a width of approximately 3 nm at the interface under saturated vapor conditions. This could be attributed to the weak interaction between the PP thin film and the Si substrate. The pathway of moisture transport to the interfacial region was along the interface rather than through the PP film because the hydrophobic PP thin film does not entirely swell with water vapor.