Precision limit for simultaneous phase and transmittance estimation with phase-shifting interferometry
Precision limit for simultaneous phase and transmittance estimation with phase-shifting interferometry
复制标题
使用相移干涉测量法同时估计相位和透射率的精度极限
DOI：
10.1103/physreva.104.033521
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发表时间：
2020
影响因子：
2.9
通讯作者：
Tatsuki Tahara
中科院分区：
文献类型：
--
作者：
Ryo Okamoto;Tatsuki Tahara
在超低光区域使用相移干涉法（PSI）将为重要的应用开辟道路，例如光毒性物质的成像和超快现象的传感。在超低光区域，光子的统计性质与实验仪器引起的其他噪声相比，可以成为主要的噪声源。本文从理论上推导了由光子的统计性质决定的用PSI同时测量样品的透射率和相位的精度极限。我们证明了PSI的精度取决于相位和透射率本身。我们还展示了透光率和相位之间的权衡关系。然后，我们将PSI与顺序最佳测量进行比较，其中样品的透射率和相位分别用于每个相应的最佳测量。我们还讨论了输入光子数随泊松分布波动的情况，并表明这种波动对PSI的透射率和相位精度都有影响。
The use of phase-shifting interferometry (PSI) in the ultra-low-light region would open the way for important applications, such as imaging of phototoxic substances and sensing of ultrafast phenomena. In the ultra-low-light region, the statistical nature of photons can be a dominant source of noise compared with other noise caused by experimental instruments. Here we theoretically derive the precision limit determined by the statistical nature of photons for simultaneously measuring the transmittance and phase of a sample with PSI. We show that the precision of PSI depends on the phase and transmittance themselves. We also show a trade-off relation between transmittance and phase. Then we compare PSI with sequential optimal measurements in which the transmittance and phase of a sample are separately measured for each corresponding optimal measurement. We also discuss the case where the input number of photons fluctuates with a Poisson distribution and show that the fluctuation affects both the transmittance and phase precision for PSI.
影响因子：
3.3
作者：
Okamoto, Ryo;Hofmann, Holger F.;Takeuchi, Shigeki
通讯作者：
Takeuchi, Shigeki
影响因子：
56.9
作者：
Nagata, Tomohisa;Okamoto, Ryo;Takeuchi, Shigeki
通讯作者：
Takeuchi, Shigeki