Cryogenic Ion Trap for Minimization of Trapped Ion Loss
Cryogenic Ion Trap for Minimization of Trapped Ion Loss
复制标题
低温离子阱可最大限度地减少捕获离子损失
DOI：
10.1143/jjap.40.4221
复制
发表时间：
2001
影响因子：
1.5
通讯作者：
S. Ohtani
中科院分区：
文献类型：
--
作者：
K. Okada;M. Wada;Takashi Nakamura;I. Katayama;L. Boesten;S. Ohtani
为了减少被捕获Be+离子的损失，研制了一种低温线性离子阱。在低温阱中对轻元素离子进行了缓冲气体冷却和激光冷却实验。氦气体冷却的Be+离子的寿命长于15分钟与液体氦冷却的陷阱，虽然他们是已知的是难以冷却的缓冲气体在传统的陷阱。激光冷却的离子晶体保持约30分钟而没有任何离子损失。
A cryogenic linear ion trap was developed for the minimization of the loss of trapped Be+ ions. Buffer gas cooling as well as laser cooling for light element ions was tested in the cryogenic trap. The lifetime for the He-gas-cooled Be+ ions was longer than 15 min with a liquid-He-cooled trap, although they are known to be difficult to cool with a buffer gas in a conventional trap. A laser-cooled ion crystal was maintained for approximately 30 min without any ion loss.