Spectroscopic characterization of material and junction in amorphous silicon solar cells
Spectroscopic characterization of material and junction in amorphous silicon solar cells
复制标题
非晶硅太阳能电池材料和结的光谱表征
DOI:
10.1016/0022-3093(85)90927-5
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发表时间:
1985
期刊:
影响因子:
--
通讯作者:
Y. Hamakawa
中科院分区:
文献类型:
--
作者:
H. Okamoto;H. Kida;Y. Hamakawa
Useful information about material and junction properties are obtained from the field-modulated reflectance and primary photocurrent measurements, all of which can be readily applied to actual solar cell structures. The paper introduces these spectroscopic techniques and presents some results as well as a brief discussion on them in conjunction with device performance.