Terahertz near-field microscopy based on an air-plasma dynamic aperture.
Terahertz near-field microscopy based on an air-plasma dynamic aperture.
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DOI:
10.1038/s41377-022-00822-8
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发表时间:
2022-05-07
影响因子:
19.4
通讯作者:
Zhang, Yan
中科院分区:
文献类型:
--
作者:
Wang, Xin-ke;Ye, Jia-sheng;Sun, Wen-feng;Han, Peng;Hou, Lei;Zhang, Yan
Terahertz (THz) near-field microscopy retains the advantages of THz radiation and realizes sub-wavelength imaging, which enables applications in fundamental research and industrial fields. In most THz near-field microscopies, the sample surface must be approached by a THz detector or source, which restricts the sample choice. Here, a technique was developed based on an air-plasma dynamic aperture, where two mutually perpendicular air-plasmas overlapped to form a cross-filament above a sample surface that modulated an incident THz beam. THz imaging with quasi sub-wavelength resolution (approximately λ/2, where λ is the wavelength of the THz beam) was thus observed without approaching the sample with any devices. Damage to the sample by the air-plasmas was avoided. Near-field imaging of four different materials was achieved, including metallic, semiconductor, plastic, and greasy samples. The resolution characteristics of the near-field system were investigated with experiment and theory. The advantages of the technique are expected to accelerate the advancement of THz microscopy. A THz near-field technique was proposed based on an air-plasma dynamic aperture, which can achieve sub-wavelength THz imaging without approaching the sample with any devices.
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影响因子:
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通讯作者:
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影响因子:
19.6
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通讯作者:
Tzortzakis, S.
DOI:
10.1109/tthz.2020.2982350
发表时间:
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影响因子:
3.2
作者:
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通讯作者:
Zhang, Yan