Terahertz near-field microscopy based on an air-plasma dynamic aperture.

Terahertz near-field microscopy based on an air-plasma dynamic aperture.
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DOI:
10.1038/s41377-022-00822-8
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发表时间:
2022-05-07
影响因子:
19.4
通讯作者:
Zhang, Yan
Zhang, Yan
中科院分区:
物理与天体物理1区
文献类型:
--
作者:
Wang, Xin-ke;Ye, Jia-sheng;Sun, Wen-feng;Han, Peng;Hou, Lei;Zhang, Yan

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太赫兹(THz)近场显微技术保留了THz辐射的优点,实现了亚波长成像,在基础研究和工业领域有着广泛的应用。在大多数太赫兹近场显微镜中,样品表面必须接近太赫兹探测器或源,这限制了样品的选择。在这里,开发了一种基于空气等离子体动态孔径的技术,其中两个相互垂直的空气等离子体重叠,在样品表面上方形成交叉灯丝,该交叉灯丝调制入射太赫兹光束。因此,观察到具有准亚波长分辨率(约λ/2,其中λ是THz光束的波长)的THz成像,而无需使用任何装置接近样品。避免了空气等离子体对样品的损伤。实现了四种不同材料的近场成像,包括金属、半导体、塑料和油脂样品。从实验和理论上研究了近场系统的分辨特性。该技术的优点有望加速THz显微镜的发展。提出了一种基于空气-等离子体动态孔径的太赫兹近场成像技术,该技术可以在不使用任何器件接近样品的情况下实现亚波长太赫兹成像。
Terahertz (THz) near-field microscopy retains the advantages of THz radiation and realizes sub-wavelength imaging, which enables applications in fundamental research and industrial fields. In most THz near-field microscopies, the sample surface must be approached by a THz detector or source, which restricts the sample choice. Here, a technique was developed based on an air-plasma dynamic aperture, where two mutually perpendicular air-plasmas overlapped to form a cross-filament above a sample surface that modulated an incident THz beam. THz imaging with quasi sub-wavelength resolution (approximately λ/2, where λ is the wavelength of the THz beam) was thus observed without approaching the sample with any devices. Damage to the sample by the air-plasmas was avoided. Near-field imaging of four different materials was achieved, including metallic, semiconductor, plastic, and greasy samples. The resolution characteristics of the near-field system were investigated with experiment and theory. The advantages of the technique are expected to accelerate the advancement of THz microscopy. A THz near-field technique was proposed based on an air-plasma dynamic aperture, which can achieve sub-wavelength THz imaging without approaching the sample with any devices.
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