Energy dispersive x-ray reflectivity technique to study thermal properties of polymer films
Energy dispersive x-ray reflectivity technique to study thermal properties of polymer films
复制标题
研究聚合物薄膜热性能的能量色散 X 射线反射率技术
DOI：
10.1063/1.1596717
复制
发表时间：
2003
影响因子：
3.2
通讯作者：
U. Pietsch
中科院分区：
文献类型：
--
作者：
M. Bhattacharya;M. Mukherjee;M. Sanyal;T. Geue;J. Grenzer;U. Pietsch
基于角度和能量色散X射线反射（EDR）技术，发展了一种研究薄膜厚度随温度变化的方法。为这种方法开发的数据分析方案结合了能量和角度色散X射线反射率（ADR）的配置文件。ADR技术提供了绝对尺度上的电子密度分布，EDR技术便于快速收集作为温度函数的反射率数据。我们通过单层和双层聚合物薄膜热膨胀的研究结果证明了所开发方法的实用性。我们可以检测以埃为单位的膜的厚度的变化，并且可以证明在确定作为温度的函数的聚合物-聚合物界面的密度分布时不同聚合物层的负和正热膨胀的相互作用。
A method to study temperature dependent thickness variation of thin films has been developed based on angle and energy dispersive x-ray reflectivity (EDR) techniques. The data analysis scheme developed for this method combines both energy and angle dispersive x-ray reflectivity (ADR) profiles. The ADR technique provides the electron density profile on an absolute scale and the EDR technique facilitates rapid collection of reflectivity data as a function of temperature. We demonstrate the utility of the developed method with results of a study of thermal expansion of single and bilayer polymer films. We could detect a change of the thickness of the film in angstroms and could demonstrate interplay of negative and positive thermal expansions of dissimilar polymer layers in determining density profiles of polymer–polymer interface as a function of temperature.