Artifacts reduction in high-acutance phase images for X-ray grating interferometry.
Artifacts reduction in high-acutance phase images for X-ray grating interferometry.
复制标题
X 射线光栅干涉测量的高锐度相位图像中的伪影减少。
DOI：
10.1364/oe.467503
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发表时间：
2022
期刊：
影响因子：
3.8
通讯作者：
A. Stolidi
中科院分区：
文献类型：
--
作者：
G. Giakoumakis;J. Primot;A. Jarnac;L. Guitard;A. Stolidi
基于X射线光栅的技术通常会在相位物体的相位恢复过程中导致伪影，表现出非常快的空间转变或突然的跳跃，特别是在无损测试和评估领域。在本文中，我们提出了一种方法，防止出现的文物，通过建立一个干涉图校正的对象强度的任何变化，并在相位恢复过程中的输入。为了说明，这种方法被应用到碳纤维试样成像的微焦点X射线管和一个单一的二维光栅。已经获得了伪影的显著减少，减少了10倍以上。由于Confidence Map工具（一种最近开发的从相位梯度信息估计误差分布的方法），该评估已通过实验进行。
X-ray grating-based techniques often lead to artifacts in the phase retrieval process of phase objects presenting very fast spatial transitions or sudden jumps, especially in the field of non-destructive testing and evaluation. In this paper, we present a method that prevents the emergence of artifacts by building an interferogram corrected from any variations of the object intensity and given as input in the phase retrieval process. For illustration, this method is applied to a carbon fiber specimen imaged by a microfocus X-ray tube and a single 2D grating. A significant reduction of artifacts has been obtained, by a factor higher than 10. This evaluation has been performed experimentally thanks to the Confidence Map tool, a recently developed method that estimates the error distribution from the phase gradient information.