Holes in the background in XRS
Holes in the background in XRS
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XRS 背景中的洞
DOI：
10.1002/xrs.1300190206
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发表时间：
1990
影响因子：
1.2
通讯作者：
B. Robinson
中科院分区：
文献类型：
--
作者：
P. Self;K. Norrish;A. Milnes;J. Graham;B. Robinson
在波长色散（WD）光谱中观察到尖锐的负谱线。在分析接近较低检测水平的微量元素时，这些“洞”可能导致严重的错误。从衍射的角度解释了洞的存在，而不是从WD分析中使用的衍射，并概述了预测洞的发生所必需的理论，重点是LiF（200）分析晶体。
Sharp negative lines have been observed in wavelength-dispersive (WD) spectra. These ‘holes’ can cause severe errors when analysing for trace elements near the lower levels of detection. The existence of the holes is explained in terms of diffraction from crystailographic planes other than those used in the WD analysis, and an overview is given of the theory necessary to predict the occurrence of the holes with emphasis on LiF(200) analysing crystals.