Custom sample environments at the ALBA XPEEM
Custom sample environments at the ALBA XPEEM
复制标题
DOI：
10.1016/j.ultramic.2016.08.016
复制
发表时间：
2016-12-01
期刊：
影响因子：
2.2
通讯作者：
Aballe, Lucia
中科院分区：
文献类型：
--
作者：
Foerster, Michael;Prat, Jordi;Aballe, Lucia
各种定制样品架为用户在 ALBA 同步加速器光电发射电子显微镜 (PEEM) 实验站提供各种非标准测量。一些显着特点包括：与许多离线沉积和表征系统兼容的超高真空 (UHV) 手提箱、用于单轴或双轴面内 (113) 和面外 (OOP) 场的内置电磁体，以及磁场与电场或电流注入的组合。为样品激励提供同步正弦信号的电子器件可以在 500 MHz 存储环射频频率下进行时间分辨测量。 (C) 2016 Elsevier B.V. 保留所有权利。
A variety of custom-built sample holders offer users a wide range of non-standard measurements at the ALBA synchrotron PhotoEmission Electron Microscope (PEEM) experimental station. Some of the salient features are: an ultrahigh vacuum (UHV) suitcase compatible with many offline deposition and characterization systems, built-in electromagnets for uni- or biaxial in-plane (113) and out-of-plane (OOP) fields, as well as the combination of magnetic fields with electric fields or current injection. Electronics providing a synchronized sinusoidal signal for sample excitation enable time-resolved measurements at the 500 MHz storage ring RF frequency. (C) 2016 Elsevier B.V. All rights reserved.