Annealing effect on the carrier transport in (2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylenevinylene): C60 bulk heterojunction
Annealing effect on the carrier transport in (2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylenevinylene): C60 bulk heterojunction
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DOI：
10.1063/1.3000439
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发表时间：
2008-10
影响因子：
3.2
通讯作者：
Quan-min Shi;Yanbing Hou;Xiao-jun Liu;Zhihui Feng
中科院分区：
文献类型：
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作者：
Quan-min Shi;Yanbing Hou;Xiao-jun Liu;Zhihui Feng
利用飞行时间技术，研究了（2-甲氧基-5-（2′-乙基己氧基）-1,4-苯基乙烯基）（MEH-PPV）和MEH-PPV:C60体异质结（BHJ）中载流子输运的退火效应。与制备样品相比，退火样品的空穴迁移率明显下降。通过分析高斯无序模型中场相关迁移率的温度依赖性，空穴迁移率的下降可归因于位置无序和能量无序的大值，分别为4.47和0.132 eV。然而，制备铝电极后退火的样品的空穴迁移率提高。虽然制备的MEH-PPV:C60器件的电子迁移率是可测量的，但只要器件经过热处理，它就在可测量范围之内。用扫描电镜和原子力显微镜观察了退火后样品的形貌。结果表明，MEH-PPV:C60 BH退火后效率的提高。
Using time-of-flight technique, the annealing effect on the carrier transport in (2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylenevinylene) (MEH-PPV) and MEH-PPV:C60 bulk heterojunction (BHJ) is investigated. Hole mobility drops evidently for the annealed samples compared to the as prepared sample. By analyzing the temperature dependence of field dependent mobility in the Gaussian disorder model, the drop of hole mobility can be attributed to the large value of both positional disorder and energetic disorder, which are 4.47 and 0.132 eV, respectively. However, hole mobility is enhanced for the samples annealed after preparing Al electrodes. Although electron mobility is measurable for the as prepared MEH-PPV:C60 devices, it is below the measurable range as long as the devices experience thermal treatment. The morphology of the annealed samples is investigated by scanning electron microscope and atomic force microscopy. The results manifest that the enhancement of the efficiency for the annealed MEH-PPV:C60 BH...