Simulation Analysis of Really Occurred Accident Caused by Short Circuit Failure of Blocking Diode and Bypass Circuit in the Photovoltaics System
Simulation Analysis of Really Occurred Accident Caused by Short Circuit Failure of Blocking Diode and Bypass Circuit in the Photovoltaics System
复制标题
光伏系统中阻断二极管和旁路电路短路故障真实事故仿真分析
DOI：
10.1109/icrera.2018.8566896
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发表时间：
2018
期刊：
影响因子：
--
通讯作者：
Masayuki Fujii
中科院分区：
文献类型：
--
作者：
N. Ishikura;Tomoki Okamoto;I. Nanno;Toshiyuki Hamada;S. Oke;Masayuki Fujii
在光伏系统（PVSs）中，使用旁路二极管（BPD）和阻塞二极管（BLD）。然而，如果BPD和BLD被感应雷电损坏，二极管的阻抗可能会变得小于10Ω。由正常串产生的电流流到包括损坏的BPD和BLD的串，并且可能产生热量并泄漏。在本文中，我们调查的原因，由于BPD和BLD同时击穿实际发生在日本使用计算机模拟。仿真结果证实了事故的原因是BPC和BLD损坏。此外，我们确认，最大的风险在于光伏板在发电时与电源调节器断开的情况。
In Photovoltaic Systems (PVSs), Bypass Diode (BPD) and Blocking Diode (BLD) are used. However, if BPD and BLD are damaged by induced lightning, the diodes’ impedance may become less than 10Ω. The currents generated by a normal string flow to a string which includes damaged BPD and BLD, and may generate heat and born out. In this paper, we investigate the cause of the accident due to BPD and BLD simultaneous breakdown actually occurred in Japan using computer simulation. The simulation results confirmed that the cause of the accident is damaged BPC and BLD. Moreover, we confirmed that the highest risk lies in the situation where PV panels are cut off from power conditioners while generating electricity.