Fault Model-Driven Test Derivation from Finite State Models: Annotated Bibliography
Fault Model-Driven Test Derivation from Finite State Models: Annotated Bibliography
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故障模型驱动的测试从有限状态模型推导：带注释的参考书目
DOI：
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发表时间：
2000
期刊：
影响因子：
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通讯作者：
A. Petrenko
中科院分区：
文献类型：
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作者：
A. Petrenko
注释的参考书目强调了从有保证的故障覆盖的正式规范生成算法测试领域的工作，即，故障模型驱动的测试派生。故障模型可以理解为一个三元组，包括有限状态规范、一致性关系和故障域（即可能实现的集合）。故障模型可以专门用于输入/输出FSM、标记转换系统或输入/输出自动机，以及许多一致性关系，如FSM等价、约简或准等价、痕迹包含或痕迹等价等。故障域通常反映测试假设，例如，它可以是具有给定状态数的所有可能的I/O fsm的集合，这是基于fsm的测试中的经典故障域。当且仅当实现与其规范之间的假定一致性关系成立时，当来自故障域的每个实现通过它时，对于给定的故障模型，测试套件是完整的。一个完整的测试套件可以为给定的故障模型提供故障覆盖保证。
The annotated bibliography highlights work in the area of algorithmic test generation from formal specifications with guaranteed fault coverage, i.e., fault model-driven test derivation. A fault model is understood as a triple, comprising a finite state specification, conformance relation and fault domain that is the set of possible implementations. The fault model can be specialized to Input/Output FSM, Labeled Transition System, or Input/Output Automaton and to a number of conformance relations such as FSM equivalence, reduction or quasiequivalence, trace inclusion or trace equivalence and others. The fault domain usually reflects test assumptions, as an example, it can be the universe of all possible I/O FSMs with a given number of states, a classical fault domain in FSM-based testing. A test suite is complete with respect to a given fault model when each implementation from the fault domain passes it if and only if the postulated conformance relation holds between the implementation and its specification. A complete test suite is said to provide fault coverage guarantee for a given fault model.