In-Situ Scanning Electron Microscopy of Individual Carbon Nanotetrahedron/Nanoribbon Structures Under a Tensile Load
In-Situ Scanning Electron Microscopy of Individual Carbon Nanotetrahedron/Nanoribbon Structures Under a Tensile Load
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拉伸载荷下单个碳纳米四面体/纳米带结构的原位扫描电子显微镜
DOI:
10.1166/jnn.2018.15391
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发表时间:
2018
影响因子:
--
通讯作者:
Kohno Hideo
中科院分区:
文献类型:
--
作者:
Sasayama Kohki;Hayashi Tetsushi;Kohno Hideo
Flattening of a carbon nanotube with a switching of the flattening direction results in the formation of a nanotetrahedron/nanoribbon structure. In this study, behavior of individual carbon nanotetra-hedron/nanoribbon structures under a tensile load is observed by means of in-situ scanning electron microscopy using micro-manipulators. Positions of breakage caused by a tensile load are not necessarily at a nanotetrahedron/nanoribbon junction. The results indicate that the nanotetrahedron/nanoribbon junctions are not mechanical weak points under a tensile load, and the nanotetra-hedron/nanoribbon structures are as strong as simple multi-walled carbon nanotubes. In addition, the nanostructures maintain their shape and do not transformed to a tubular form.