Microstructural Design of Dielectrics for Ni-MLCC with Ultra-thin Active Layers
Microstructural Design of Dielectrics for Ni-MLCC with Ultra-thin Active Layers
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DOI：
10.2109/jcersj.115.360
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发表时间：
2007
影响因子：
1.1
通讯作者：
Y. Mizuno;T. Hagiwara;H. Kishi
中科院分区：
文献类型：
--
作者：
Y. Mizuno;T. Hagiwara;H. Kishi
在BT- ho - mg - mn体系中，研究了原料BaTiO3 （BT）粉体粒度、结晶度等特性对镍内电极x7r型多层陶瓷电容器（Ni- mlcc）微观结构和电性能的影响。对于MLCC样品，室温下的介电常数随晶粒尺寸的减小而减小。特别是在小于200nm的晶粒尺寸上，它急剧下降。此外，电介质常数在很大程度上取决于原料BT粉末的四边形（c/a），而半最大全宽（FWHM）对电性能的影响很小。从高碳/a的BT原料粉中获得的样品显示出晶粒生长受到抑制，它们由大量的核壳颗粒组成，在核心区域有清晰的区域模式。因此，高c/a的样品具有较高的介电常数和良好的电容温度特性。
The influence of raw BaTiO3 (BT) powder characteristics such as particle size and crystallinity on the microstructure as well as the electrical properties of X7R-type multilayer ceramic capacitors with Ni internal electrodes (Ni-MLCCs) was investigated in the BT-Ho-Mg-Mn system. For the MLCC samples, the dielectric constant at room temperature decreased with a decrease in the grain size. In particular, it drastically decreased for the grain sizes of less than 200 nm. Furthermore, the dielectric constant was considerably dependent on the tetragonality (c/a) of the raw BT powder, whereas the full-width at half maximum (FWHM) had little effect on the electrical properties. The samples obtained from the raw BT powder with high c/a showed the inhibited grain growth and they consisted of a large number of core-shell grains having clear domain patterns in the core region. Accordingly, the sample with high c/a showed high dielectric constant and good temperature characteristics with respect to capacitance.