Direct observation of Barkhausen avalanche in Co thin films
Direct observation of Barkhausen avalanche in Co thin films
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DOI：
10.1103/physrevlett.90.087203
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发表时间：
2003-02-28
影响因子：
8.6
通讯作者：
Shin, SC
中科院分区：
文献类型：
--
作者：
Kim, DH;Choe, SB;Shin, SC
本文报道了临界状态下钴多晶薄膜中巴克豪森雪崩的直接全场磁光观测。我们提供了实验证据的有效性的现象学模型的巴克豪森雪崩最初提出的Cizeau，Zaplett，杜林，和斯坦利[物理。79，4669（1997）]，其中该模型描述了在考虑长程偶极相互作用的情况下由局部缺陷变形的180度型柔性畴壁。对于厚度为5 ~ 50 nm的所有样品，巴克豪森跳跃区均呈幂律标度分布，临界指数τ近似为1.33，与模型的二维预测结果雅阁。
We report direct full-field magneto-optical observations of Barkhausen avalanches in Co polycrystalline thin films at criticality. We provide experimental evidence for the validity of a phenomenological model of the Barkhausen avalanche originally proposed by Cizeau, Zapperi, Durin, and Stanley [Phys. Rev. Lett. 79, 4669 (1997)], where the model describes a 180degrees-type flexible domain wall deformed by a localized defect with consideration of long-range dipolar interaction. The Barkhausen jump areas show a power-law scaling distribution with critical exponent tausimilar to1.33 for all the samples having different thickness from 5 to 50 nm, which is in accord with the two-dimensional prediction of the model.