Quantitative nanotribology by atomic force microscopy
Quantitative nanotribology by atomic force microscopy
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DOI：
10.1088/0022-3727/38/6/018
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发表时间：
--
期刊：
影响因子：
3.13
通讯作者：
N Morel
中科院分区：
文献类型：
--
作者：
N Morel; Ph Tordjeman; M Ramonda
Nanotribology with an atomic force microscope (AFM) requires an accurate calibration of the mechanical response of the cantilever. To determine the friction coefficient on the nanoscale, we have developed a new calibration method to determine the normal and lateral cantilever stiffness, and , used to calculate the normal and friction forces, which allow us to calculate the nanofriction coefficient μ. Comparative experiments on a silicon wafer with two cantilevers of different dimensions validate our calibration method. The nanofriction coefficient μ of two materials, one silicate glass and the same glass with a 100 Å SnO 2 layer, has been measured by AFM after calibrating the cantilever stiffness. The different values of μ show the lubrication effects of the SnO 2 layer on the nanoscale.
