Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an a-Al(Fe,Mn)Si dispersoid
Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an a-Al(Fe,Mn)Si dispersoid
复制标题
用于原子探针断层扫描的 Al-6XXX 合金样品的氙等离子体聚焦离子束制备，包括 a-Al(Fe,Mn)Si 弥散体的分析
DOI：
10.1016/j.matchar.2021.111194
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发表时间：
2021
影响因子：
4.7
通讯作者：
Famelton J
中科院分区：
文献类型：
--
作者：
Famelton J
采用等离子体聚焦离子束技术对6XXX铝合金进行了原位原子探针扫描。在合金中观察到的沉淀物和溶质团簇的性质和分布在标准电抛光方法和等离子体制备之间没有观察到不同。通过现场特定试样制备，对α-Al（Fe，Mn）Si弥散体的分析表明，在相界和弥散体的壳中存在偏析。
A Xe plasma Focussed Ion Beam instrument was used to prepare in-situ specimens for Atom Probe Tomography from a bulk sample of an aluminium 6XXX alloy. The nature and distribution of precipitates and solute clusters observed in the alloy are not observed to differ between standard electropolishing methods and Xe plasma preparation. Enabled by site specific specimen preparation, analysis of anα-Al(Fe,Mn)Si dispersoid shows segregation at the phase boundary and in the shell of the dispersoid.