X-ray investigation of subsurface interstitial oxygen at Nb/oxide interfaces
X-ray investigation of subsurface interstitial oxygen at Nb/oxide interfaces
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DOI：
10.1063/1.2889474
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发表时间：
2008-03-10
影响因子：
4
通讯作者：
Andersen, J.
中科院分区：
文献类型：
--
作者：
Delheusy, M.;Stierle, A.;Andersen, J.
我们已经研究了自然氧化物层的Nb（110）表面加热时，结合X射线反射率，掠入射漫散射，和核心水平的光谱溶解。天然氧化物在加热到145 ℃后部分地从Nb（2）O（5）还原为NbO（2），并且观察到在100埃的深度中，次表面间隙氧的富集类似于70%。在加热到300摄氏度后，氧化物还原为NbO，多余的表面下的氧溶解到主体中。我们的方法可以应用于进一步研究次表面间隙氧对铌射频腔性能的影响。(C)2008年美国物理学会。(C)2008年美国物理学会。
We have investigated the dissolution of a natural oxide layer on a Nb(110) surface upon heating, combining x-ray reflectivity, grazing incidence diffuse scattering, and core-level spectroscopy. The natural oxide reduces after heating to 145 degrees C partially from Nb(2)O(5) to NbO(2), and an enrichment in subsurface interstitial oxygen by similar to 70% in a depth of 100 A is observed. After heating to 300 degrees C, the oxide reduces to NbO and the surplus subsurface oxygen gets dissolved into the bulk. Our approach can be applied for further investigation of the effect of subsurface interstitial oxygen on the performance of niobium rf cavities. (C) 2008 American Institute of Physics. (C) 2008 American Institute of Physics.