Analysis of the Angular Distribution and the Intensity of Parametric X-Ray Radiation in a Bragg Case.
Analysis of the Angular Distribution and the Intensity of Parametric X-Ray Radiation in a Bragg Case.
复制标题
分析角度分布和参数X射线辐射的强度。
DOI：
10.1143/jpsj.67.1044
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发表时间：
1998
影响因子：
1.7
通讯作者：
A. Noda
中科院分区：
文献类型：
--
作者：
Y. Hayakawa;M. Seto;Y. Maeda;T. Shirai;A. Noda
在布拉格几何中测量了250 μm和3mm厚硅单晶的PXR角分布，并进行了数值计算。在计算中，高斯分布用于光束的角发散，这是由于材料中的电子的多次散射。高阶反射与基波反射的强度比表明晶体中X射线的吸收很小。通过考虑反常透射对运动学理论的影响，对所得到的角分布进行了实际解释。
The angular distributions of PXR from 250 µm and 3 mm thick silicon single crystals were measured in a Bragg geometry and the numerical calculation for them were also carried out. In the calculation a Gaussian distribution was used for the angular divergence of the beam, which is due to the multiple scattering of electrons in the material. The intensity ratios of the higher order reflections to the fundamental one suggest that the absorption of X-rays in the crystal is small. The obtained angular distributions are also explained by including the effect of the anomalous transmission to the kinematical theory practically.