Strain-Modulated Bandgap and Piezo-Resistive Effect in Black Phosphorus Field-Effect Transistors
Strain-Modulated Bandgap and Piezo-Resistive Effect in Black Phosphorus Field-Effect Transistors
复制标题
黑磷场效应晶体管中的应变调制带隙和压阻效应
DOI:
10.1021/acs.nanolett.7b02624
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发表时间:
2017
期刊:
影响因子:
10.8
通讯作者:
Zhang Yuanbo
中科院分区:
文献类型:
--
作者:
Zhang Zuocheng;Li Likai;Horng Jason;Wang Nai Zhou;Yang Fangyuan;Yu Yijun;Zhang Yu;Chen Guorui;Watanabe Kenji;Taniguchi Takashi;Chen Xian Hui;Wang Feng;Zhang Yuanbo
Energy bandgap largely determines the optical and electronic properties of a semiconductor. Variable bandgap therefore makes versatile functionality possible in a single material. In layered material black phosphorus, the bandgap can be modulated by the number of layers; as a result, few-layer black phosphorus has discrete bandgap values that are relevant for optoelectronic applications in the spectral range from red, in monolayer, to mid-infrared in the bulk limit. Here, we further demonstrate continuous bandgap modulation by mechanical strain applied through flexible substrates. The strain-modulated bandgap significantly alters the density of thermally activated carriers; we for the first time observe a large piezo-resistive effect in black phosphorus field-effect transistors (FETs) at room temperature. The effect opens up opportunities for future development of electromechanical transducers based on black phosphorus, and we demonstrate an ultrasensitive strain gauge constructed from black phosphorus thin crystals.