Development of MOCVD Technology for Integrated YBCO Layer/Buffer Layer Fabrication for Coated Conductors
Development of MOCVD Technology for Integrated YBCO Layer/Buffer Layer Fabrication for Coated Conductors
复制标题
DOI:
10.1109/tasc.2009.2018147
复制
发表时间:
2009-06
影响因子:
1.8
通讯作者:
A. Molodyk;M. Novozhilov;S. Bitkowsky;S. Street;A. Delaney;L. Castellani;A. Ignatiev
中科院分区:
文献类型:
--
作者:
A. Molodyk;M. Novozhilov;S. Bitkowsky;S. Street;A. Delaney;L. Castellani;A. Ignatiev
Chemical deposition of all buffer and YBCO layers is recognized as the most economical approach to coated conductor manufacturing. Metal Oxide Technologies Inc. (MetOx) has been developing a cost-effective technology to deposit all buffer and superconducting layers by MOCVD. High Ic = 201 A/cm and Jc = 1.53 MA/cm2 values are obtained on ORNL RABiTS buffers. The best superconducting properties of MetOx YBCO films of Jc = 3.34 MA/cm2 and Ic = 480 A/cm have been achieved on LANL IBAD buffers. MetOx MOCVD coated conductors demonstrate promising Ic = 137 A/cm and Jc = 1.10 MA/cm2. Good superconducting performance has been demonstrated on several 1 m long YBCO tapes. Pinning enhancement via Y2O3 doping in YBCO has been successfully implemented. Very high MOCVD growth rates of 1.25 mum/min have been demonstrated producing well-textured superconducting YBCO films.