Relaxation Spectrum Analysis of Semiconductor‐Electrolyte Interface ‐ TiO2
Relaxation Spectrum Analysis of Semiconductor‐Electrolyte Interface ‐ TiO2
复制标题
半导体-电解质界面 - TiO2 的弛豫谱分析
DOI：
10.1149/1.2128931
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发表时间：
1979
期刊：
影响因子：
--
通讯作者：
M. Tomkiewicz
中科院分区：
文献类型：
--
作者：
M. Tomkiewicz
A new technique to evaluate the equivalent circuit elements of a semiconductor-electrolyte interface is presented. The technique is based on impedance measurements over a wide frequency range. We present results on n-type TiO2-aqueous electrolyte interfaces, which we can represent in terms of an equivalent circuit of passive elements. The equivalent circuit was interpreted in terms of two space charge layers with two different doping levels. The effect of surface treatment on the relative areas and on the lateral distribution of the two regions is also presented.
