Magnetic force microscopy of alternating magnetic field gradient by frequency modulation of tip oscillation
Magnetic force microscopy of alternating magnetic field gradient by frequency modulation of tip oscillation
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DOI：
10.1063/1.3074786
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发表时间：
2009-03
影响因子：
3.2
通讯作者：
H. Saito;H. Ikeya;G. Egawa;S. Ishio;S. Yoshimura
中科院分区：
文献类型：
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作者：
H. Saito;H. Ikeya;G. Egawa;S. Ishio;S. Yoshimura
提出了一种利用调频（FM）尖端振荡现象测量交变磁场的磁力显微镜（MFM）新技术。利用金属隙（MIG）型环形磁头对高矫顽力MFM针尖施加交流磁场，在针尖振荡中检测到窄带FM现象。实验中，压电元件在悬臂梁谐振频率附近以恒频fc驱动MFM尖端，并在MFM尖端施加频率高达10 kHz的交流磁场。施加交流磁场，观察到两个频率为fc±fm的边带谱。边带光谱强度随外加电流值的增加呈线性增加。通过对MFM信号的频谱分析，发现FM确实存在。这种调频现象是由头部的场梯度施加在悬臂上的力引起的。FM现象是在…
A new magnetic force microscopy (MFM) technique for measuring alternating magnetic field (ac magnetic field) was proposed by using frequency modulation (FM) phenomenon of tip oscillation. We detected a narrowband FM phenomenon in the tip oscillation of a high-coercivity MFM tip by applying an ac magnetic field to the tip by using a metal-in-gap (MIG) type ring head. In the experiment, the MFM tip was driven at a constant frequency fc near the resonant frequency of the cantilever by a piezoelectric element, and the ac magnetic field with a frequency fm up to 10 kHz was applied to the MFM tip. Two sideband spectra with a frequency of fc±fm were observed by applying ac magnetic field. The intensity of sideband spectra increased linearly with increasing applied current value of the MIG head. It was observed that FM occurred from the analysis of frequency spectra of the MFM signals. This FM phenomenon is caused by the force applied on the cantilever by the field gradient of the head. The FM phenomenon is under...