New Microscope and Ion Accelerators for Materials Investigations (MIAMI-2) system at the University of Huddersfield
New Microscope and Ion Accelerators for Materials Investigations (MIAMI-2) system at the University of Huddersfield
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DOI：
10.1016/j.nima.2019.03.074
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发表时间：
2019-07-01
影响因子：
1.4
通讯作者：
Hinks, J. A.
中科院分区：
文献类型：
--
作者：
Greaves, G.;Mir, H.;Hinks, J. A.
辐射损伤是一个复杂的动力学过程，多个原子机制相互作用并竞争决定材料的终态。具有原位离子辐照的透射电子显微镜（TEM）允许直接观察样品从原始状态到最终状态的微观结构演变。哈德斯菲尔德大学建立了一种新的带有原位离子照射的TEM：用于材料研究的显微镜和离子加速器（迈阿密-2）系统。迈阿密-2将300 kV TEM与中能350 kV和低能20 kV离子束线相结合。虽然中等能量束线可用于大多数物质，直到Au，但低能量束线主要设计用于注入轻离子物质，例如H和He。这些可以单独使用或混合进入TEM之前，允许双离子束辐照实验，例如，模拟位移损伤和从（n，α）核反应引入He的综合效应。TEM可在60-300 kV电压范围内工作，并配备了1600万像素的数码相机、能量过滤成像系统和用于元素和化学分析的能量色散X射线光谱仪。样品温度可在-170 ° C至1300 ° C之间变化，气体注入系统可在样品位置实现高达10（-2）mbar的气体环境压力。新的迈阿密-2系统是一个强有力的工具，用于调查在加工过程中和/或在核应用、纳米技术、半导体加工和地球外环境等领域使用时暴露于辐照环境的各种材料的辐射损伤。
Radiation damage is a complex dynamic process with multiple atomic mechanisms interacting and competing to determine the end state of the material. Transmission electron microscopy (TEM) with in-situ ion irradiation allows direct observation of the microstructural evolution of a sample from the virgin to end state. A new TEM with in-situ ion irradiation has been established at the University of Huddersfield: the Microscope and Ion Accelerators for Materials Investigations (MIAMI-2) system. MIAMI-2 combines a 300 kV TEM with medium-energy 350 kV and low-energy 20 kV ion beamlines. Whilst the medium-energy beamline can be used for most species up to Au, the low-energy beamline is primarily designed for implanting light-ion species such as H and He. These can be used individually or mixed prior to entering the TEM allowing dual-ion-beam irradiation experiments to, for example, simulate the combined effects of displacement damage and the introduction of He from (n, alpha) nuclear reactions. The TEM can operate from 60-300 kV and is equipped with a 16 megapixel digital camera, an energy-filtered imaging system and an energy-dispersive X-ray spectrometer for elemental and chemical analysis. Sample temperature can be varied from -170 degrees C to 1300 degrees C and a gas injection system enables gaseous environments at pressures of up to 10(-2) mbar at the sample position. The new MIAMI-2 system is a powerful tool for the investigation of radiation damage in a wide range of materials which are exposed to irradiating environments either during processing and/or whilst in-service in areas including nuclear applications, nanotechnology, semiconductor processing and extraterrestrial environments.