Synchrotron Soft X‐ray Absorption Spectroscopy Study of Carbon and Silicon Nanostructures for Energy Applications
Synchrotron Soft X‐ray Absorption Spectroscopy Study of Carbon and Silicon Nanostructures for Energy Applications
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DOI：
10.1002/adma.201304507
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发表时间：
2014-12
影响因子：
29.4
通讯作者：
J. Zhong;Hui Zhang;Xuhui Sun;Shui-Tong Lee
中科院分区：
文献类型：
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作者：
J. Zhong;Hui Zhang;Xuhui Sun;Shui-Tong Lee
碳材料和硅材料是科学技术发展史上最重要的两种材料。在过去的二十年里，C和Si纳米材料，例如，碳纳米管、石墨烯和硅纳米线以及量子点也已经成为纳米科学和纳米技术中最令人感兴趣的纳米材料，因为它们具有无数有前途的应用，例如用于电子学、传感器、生物技术等。特别地，碳和硅纳米结构正被用于与能量相关的应用，例如催化、电池、太阳能电池等，取得了重大进展。理解纳米结构的表面和电子结构的性质在能量转换和存储纳米系统的开发和改进中起着关键作用。同步辐射软X射线吸收光谱（XAS）和相关技术，如X射线发射光谱（XES）和扫描透射X射线显微镜（STXM），在揭示C和Si纳米材料的表面和电子结构方面显示出独特的能力。在这篇综述中，XAS被证明是一种强大的技术，用于探测碳和硅纳米材料的化学键合，电子结构和表面化学，这可以大大提高这些纳米材料在能源应用中的基本理解和适用性。重点是XAS作为传统显微镜和光谱学的补充工具，有效地提供有关碳和硅纳米结构的化学和结构信息的独特优势。采用XAS原位，真实的-时间的性质演变的C和Si纳米结构的研究，阐明在能量转换或存储过程中的机制进行了讨论。
Carbon and silicon materials are two of the most important materials involved in the history of the science and technology development. In the last two decades, C and Si nanoscale materials, e.g., carbon nanotubes, graphene, and silicon nanowires, and quantum dots, have also emerged as the most interesting nanomaterials in nanoscience and nanotechnology for their myriad promising applications such as for electronics, sensors, biotechnology, etc. In particular, carbon and silicon nanostructures are being utilized in energy‐related applications such as catalysis, batteries, solar cells, etc., with significant advances. Understanding of the nature of surface and electronic structures of nanostructures plays a key role in the development and improvement of energy conversion and storage nanosystems. Synchrotron soft X‐ray absorption spectroscopy (XAS) and related techniques, such as X‐ray emission spectroscopy (XES) and scanning transmission X‐ray microscopy (STXM), show unique capability in revealing the surface and electronic structures of C and Si nanomaterials. In this review, XAS is demonstrated as a powerful technique for probing chemical bonding, the electronic structure, and the surface chemistry of carbon and silicon nanomaterials, which can greatly enhance the fundamental understanding and also applicability of these nanomaterials in energy applications. The focus is on the unique advantages of XAS as a complementary tool to conventional microscopy and spectroscopy for effectively providing chemical and structural information about carbon and silicon nanostructures. The employment of XAS for in situ, real‐time study of property evolution of C and Si nanostructures to elucidate the mechanisms in energy conversion or storage processes is also discussed.