Evaluation of thin section standards for local analysis of light elements by micro-PIXE analysis
Evaluation of thin section standards for local analysis of light elements by micro-PIXE analysis
复制标题
通过微型 PIXE 分析评估轻元素局部分析的薄片标准
DOI：
10.1142/s0129083511002124
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发表时间：
2011
期刊：
影响因子：
--
通讯作者：
M.Oikawa
中科院分区：
文献类型：
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作者：
S.Homma-Takeda;K.Suzuki;K.Harumoto;T.Yoshitomi;H.Iso;T.Ishikawa;T.Konishi;M.Oikawa
对于通过微 PIXE（粒子诱导 X 射线发射）分析对轻元素进行定量测量，预计需要合适的外部标准。本文通过微量 PIXE 分析评估了含有磷 (P) 和钾 (K) 的聚乙烯醇溶液薄片作为标准品的用途。添加到标准材料中的 P 和 K 的均匀性通过标准品的 1 μm 和 10 μm 步长扫描进行验证。标准品 P 和 K 的 X 射线强度的相对标准偏差分别 < 25% 和 < 16%。从 100 × 100 μm2 区域获得的 X 射线强度与元素浓度之间的校准线也是可以接受的，这表明薄片标准足以作为轻元素 micro-PIXE 测量的外部标准。
For quantitative measurements of light elements by micro-PIXE (particle-induced X-ray emission) analysis, suitable external standards have been expected. In this paper thin sections of polyvinyl alcohol solution containing phosphorus (P) and potassium (K) were assessed for their purpose as standards by micro-PIXE analysis. Homogeneity of P and K added to the standard materials were validated by 1 μm and 10 μm-step scanning of the standard. The relative standard deviations of the X-ray intensity of the standards P and K were < 25% and <16%, respectively. The calibration line between the X-ray intensity obtained from a 100 × 100 μm2area and the elements concentration was also acceptable, indicating that the thin section standards are adequate for an external standard of micro-PIXE measurements for light elements.