Aging-aware adaptive voltage scaling of product blocks in 28nm nodes

Aging-aware adaptive voltage scaling of product blocks in 28nm nodes
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28nm 节点中产品模块的老化感知自适应电压缩放

DOI：
10.1109/irps.2016.7574582
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发表时间：
2016
期刊：
2016 IEEE International Reliability Physics Symposium (IRPS)
影响因子：
--
通讯作者：
C. Parthasarathy
C. Parthasarathy
中科院分区：
--
文献类型：
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作者：
V. Huard;F. Cacho;A. Benhassain;C. Parthasarathy

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这项工作提供的元素，突出的基本要素，对老化意识的自适应电压缩放（A-AVS）计划的数字电路。通过监测器定义和插入流程、监测器特性（均值和扩展）等主要里程碑，在28 nm High-K节点上对A-AVS方案进行了真实的产品测试。这项研究提供了新的观点对产品硬化和能源效率之间的权衡老化引起的减速，特别是在自适应电压缩放（AVS）的背景下，用于补偿过程中心。
This work provides elements to highlight the fundamental elements towards an Aging-aware Adaptive Voltage Scaling (A-AVS) scheme of digital circuits. Through main milestones including monitors' definition and insertion flow, monitors' characterization (mean and spread), the A-AVS scheme is assessed on real product blocks in 28nm High-K nodes. This study offers new perspectives towards the trade-off between product hardening and energy efficiency with respect to aging-induced slow-down, especially in context where Adaptive Voltage Scaling (AVS) is used to compensate for process centerings.