Scan cell design for launch-on-shift delay tests with slow scan enable
Scan cell design for launch-on-shift delay tests with slow scan enable
复制标题
用于启用慢速扫描的轮班启动延迟测试的扫描单元设计
DOI：
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发表时间：
2007
影响因子：
1.2
通讯作者：
A. Singh
中科院分区：
文献类型：
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作者：
Gefu Xu;A. Singh
大多数基于扫描的设计将扫描使能实现为低速全局控制信号，因此只能实现捕获时启动(LOC)延迟测试。移位启动(LOS)测试通常更有效，用更少的测试向量实现更高的故障覆盖率，但需要启用快速扫描。提出了一种通过在每个触发器中添加少量逻辑以使慢扫描使能信号与时钟沿对齐来实现LOS测试的低成本解决方案。与最近的其他方案相比，新设计的效率要高得多，并且可以支持全面的视距测试。它还可以针对混合LOC/LOS测试进行进一步修改，使ISCAS89基准的转换延迟故障覆盖率接近95%。
Most scan-based designs implement the scan enable as a slow speed global control signal, and can therefore only implement launch-on-capture (LOC) delay tests. Launch-on-shift (LOS) tests are generally more effective, achieving higher fault coverage with significantly fewer test vectors, but requiring a fast scan enable. A low cost solution for implementing LOS tests by adding a small amount of logic in each flip-flop to align the slow scan enable signal to the clock edge is presented. The new design is much more efficient when compared with other recent proposals and can support full LOS testing. It can be further modified for mixed LOC/ LOS tests that achieve transition delay fault coverage approaching 95% for the ISCAS89 benchmarks.