Locally rewritable codes for resistive memories
Locally rewritable codes for resistive memories
复制标题
电阻存储器的本地可重写代码
DOI:
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发表时间:
2016
期刊:
影响因子:
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通讯作者:
B. Kumar
中科院分区:
文献类型:
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作者:
Yongjune Kim;Abhishek A. Sharma;R. Mateescu;Seung;Z. Bandic;J. Bain;B. Kumar
We propose locally rewritable codes (LWC) for resistive memories inspired by locally repairable codes (LRC) for distributed storage systems. Small values of repair locality of LRC enable fast repair of a single failed node since the lost data in the failed node can be recovered by accessing only a small fraction of other nodes. By using rewriting locality, LWC can improve endurance and power consumption which are major challenges for resistive memories. We point out the duality between LRC and LWC, which indicates that existing construction methods of LRC can be applied to construct LWC.