Electron microscopy of electromagnetic waveforms
Electron microscopy of electromagnetic waveforms
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DOI：
10.1126/science.aaf8589
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发表时间：
2016-07-22
期刊：
影响因子：
56.9
通讯作者：
Baum, P.
中科院分区：
文献类型：
--
作者：
Ryabov, A.;Baum, P.
Rapidly changing electromagnetic fields are the basis of almost any photonic or electronic device operation. We report how electron microscopy can measure collective carrier motion and fields with subcycle and subwavelength resolution. A collimated beam of femtosecond electron pulses passes through a metamaterial resonator that is previously excited with a single-cycle electromagnetic pulse. If the probing electrons are shorter in duration than half a field cycle, then time-frozen Lorentz forces distort the images quasi-classically and with subcycle time resolution. A pump-probe sequence reveals in a movie the sample's oscillating electromagnetic field vectors with time, phase, amplitude, and polarization information. This waveform electron microscopy can be used to visualize electrodynamic phenomena in devices as small and fast as available.
