Development of a high accuracy, large range and backlash free single-tilt/rotation (alpha-gamma) holder for precise alignment of TEM samples
Development of a high accuracy, large range and backlash free single-tilt/rotation (alpha-gamma) holder for precise alignment of TEM samples
复制标题
开发高精度、大范围、无间隙的单倾斜/旋转（α-γ）支架，用于精确对准 TEM 样品
DOI：
10.1017/s143192760808882x
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发表时间：
2008
影响因子：
2.8
通讯作者：
E. Stach
中科院分区：
文献类型：
--
作者：
Norman J. Salmon;David Vetter;E. Stach
2008年8月3日至8月7日在美国新墨西哥州的阿尔伯克基举行的显微镜和微量分析2008年会议上发表的论文的扩展摘要
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008