Differences in nature of defects between SrBi2Ta2O9 and Bi4Ti3O12
Differences in nature of defects between SrBi2Ta2O9 and Bi4Ti3O12
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DOI：
10.1063/1.123709
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发表时间：
1999-03
影响因子：
4
通讯作者：
B. Park;Seung-Jae Hyun;S. Bu;T. Noh;J. Lee;Hyongsub Kim;Tae Hoon Kim;W. Jo
中科院分区：
文献类型：
--
作者：
B. Park;Seung-Jae Hyun;S. Bu;T. Noh;J. Lee;Hyongsub Kim;Tae Hoon Kim;W. Jo
利用X射线光电子能谱（XPS）测量了SrBi 2 Ta 2 O 9（SBT）和Bi 4 Ti 3 O 12（BTO）薄膜中的缺陷性质。在SBT膜中，发现金属-氧八面体处的氧离子比Bi 2 O2层处的氧离子稳定得多。另一方面，对于BTO膜，氧空位可以在钛-氧八面体和Bi 2 O2层处被诱导。我们认为，金属氧八面体稳定性的差异可能与SBT和BTO薄膜的不同疲劳行为有关。
X-ray photoemission spectroscopy measurements were executed to compare the nature of defects in SrBi2Ta2O9 (SBT) and Bi4Ti3O12 (BTO) films. In the SBT film, it was found that the oxygen ions at the metal–oxygen octahedra were much more stable than those at the Bi2O2 layers. On the other hand, for the BTO film, oxygen vacancies could be induced both at the titanium–oxygen octahedra and at the Bi2O2 layers. We suggested that the difference in stability of the metal–oxygen octahedra should be related to different fatigue behaviors of the SBT and the BTO films.