Ionization dynamics of cluster targets irradiated by x-ray free-electron-laser light
Ionization dynamics of cluster targets irradiated by x-ray free-electron-laser light
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DOI：
10.1103/physreva.80.053202
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发表时间：
2009-11
影响因子：
2.9
通讯作者：
Tatsufumi Nakamura;Y. Fukuda;Y. Kishimoto
中科院分区：
文献类型：
--
作者：
Tatsufumi Nakamura;Y. Fukuda;Y. Kishimoto
用三维粒子模拟程序研究了X射线自由电子激光（XFEL）光与单个团簇靶的相互作用。考虑了等离子体动力学以及相关的原子过程，如光电离，俄歇效应，碰撞电离和弛豫，场电离。结果表明，随着XFEL强度的增加，场电离，这是占主导地位的电离过程超过其他原子过程，导致快速的目标电离。对由于XFEL光的照射而引起的目标损伤进行了数值评估，这给出了XFEL强度的估计，以便将目标损伤抑制在成像的容许范围内。
Interactions of x-ray free-electron laser (XFEL) light with a single cluster target are numerically investigated by using a three-dimensional particle-in-cell code. The plasma dynamics as well as relevant atomic processes are taken into account, such as photoionization, the Auger effect, collisional ionization and relaxation, and field ionization. It is found that as the XFEL intensity increases to as high as, the field ionization, which is the dominant ionization process over the other atomic processes, leads to rapid target ionization. The target damage due to the irradiation by XFEL light is numerically evaluated, which gives an estimation of the XFEL intensity so as to suppress the target damage within a tolerable range for imaging.