Residual Stress Analysis by Monochromatic High-Energy X-rays
Residual Stress Analysis by Monochromatic High-Energy X-rays
复制标题
通过单色高能 X 射线进行残余应力分析
DOI：
10.1002/9783527621927.ch9
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发表时间：
2008
影响因子：
2.5
通讯作者：
R. Martins
中科院分区：
文献类型：
--
作者：
R. Martins
本章介绍使用单色高能同步辐射（角度色散装置）进行残余应力分析。解释并比较了具有三维空间分辨率和时间分辨率的无损测量的最新技术。描述了几个示例情况。简要介绍了对面阵X射线探测器衍射数据的分析。
The chapter deals with residual stress analysis using monochromatic high‐energy synchrotron radiation (angle dispersive setup). State of the art techniques for non‐destructive measurements with three dimensional spatial resolution and with time resolution are explained and compared. Several example cases are described. A brief introduction to the analysis of diffraction data from area X‐ray detectors is given.