Inter- and Intragrain Inhomogeneity in 2D Perovskite Thin Films Revealed by Relative Grain Orientation Imaging Using Low-Frequency Polarized Raman Microspectroscopy
Inter- and Intragrain Inhomogeneity in 2D Perovskite Thin Films Revealed by Relative Grain Orientation Imaging Using Low-Frequency Polarized Raman Microspectroscopy
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DOI:
10.1021/acs.jpclett.0c00992
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发表时间:
2020-05-21
影响因子:
5.7
通讯作者:
Shigeto, Shinsuke
中科院分区:
文献类型:
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作者:
Toda, Shogo;Yanagita, Naoya;Shigeto, Shinsuke
Two-dimensional (2D) organic-inorganic hybrid lead halide perovskites make up an emerging class of semiconductor materials for optoelectronic applications such as solar cells. The grain structure of polycrystalline 2D perovskites is one of the key factors that dictate their functionality in the devices, but currently available methods for in situ, chemically specific characterization of 2D perovskite grains are scarce. Here we show that ultra-low-frequency polarized Raman microspectroscopy is a facile yet powerful tool for visualizing relative grain orientations within 2D perovskite thin films. We demonstrate this method on the simplest 2D perovskite, (CH3(CH2)(3)NH3)(2)PbI4. Hierarchical clustering and detailed band decomposition analysis of the low-frequency polarized Raman imaging data reveal not only relative grain orientations but also intragrain inhomogeneity. We envisage that with high chemical specificity, this method will find broad applications ranging from other 2D perovskites to perovskite-based optoelectronic devices.