Micron size laser-wire system at the ATF extraction line, recent results and ATF-II upgrade
Micron size laser-wire system at the ATF extraction line, recent results and ATF-II upgrade
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ATF 提取线上的微米尺寸激光线系统、最新结果和 ATF-II 升级
DOI：
10.1016/j.nima.2010.03.071
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发表时间：
2010
期刊：
影响因子：
--
通讯作者：
Aryshev A
中科院分区：
文献类型：
--
作者：
Aryshev A
KEK加速器测试设备（ATF）引出线激光线系统去年已经升级，可以测量微米级横向尺寸的电子束。最后的测量使用升级系统从最近的操作在ATF，演示原始测量的顺序3μm RMS。本文还讨论了对这一测量的主要贡献。
The KEK Accelerator test facility (ATF) extraction line laser-wire system has been upgraded last year allowing the measurement of micron scale transverse size electron beams. The last measurements using the upgraded system from recent operation at the ATF are presented, demonstrating raw measurements of order 3μm RMS. The main component contributions to this measurement are also discussed.