High energy transmission annular beam X-ray diffraction.

High energy transmission annular beam X-ray diffraction.
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DOI:
10.1364/oe.23.006304
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发表时间:
2015-03
期刊:
影响因子:
3.8
通讯作者:
A. Dicken;Alex Shevchuk;K. Rogers;S. Godber;Paul G. Evans
A. Dicken;Alex Shevchuk;K. Rogers;S. Godber;Paul G. Evans
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
A. Dicken;Alex Shevchuk;K. Rogers;S. Godber;Paul G. Evans

文献摘要

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我们通过沿着高能 X 射线环形束的对称轴线性平移扩展的多晶样品来演示材料相恢复。从光束所包围的暗区域记录了一系列伪单色衍射图像。我们以 X 射线衍射强度中亮点的形式测量不同环形规格体积的布拉格最大值。我们展示了三种具有不同晶体结构特性的材料的实验数据,即接近理想、大晶粒尺寸和择优取向。该技术对于需要高穿透辐射的分析检查任务(例如安全检查、医学和无损检测)显示出巨大的前景。
We demonstrate material phase retrieval by linearly translating extended polycrystalline samples along the symmetry axis of an annular beam of high-energy X-rays. A series of pseudo-monochromatic diffraction images are recorded from the dark region encompassed by the beam. We measure Bragg maxima from different annular gauge volumes in the form of bright spots in the X-ray diffraction intensity. We present the experiment data from three materials with different crystallographic structural properties i.e. near ideal, large grain size and preferred orientation. This technique shows great promise for analytical inspection tasks requiring highly penetrating radiation such as security screening, medicine and non-destructive testing.