Analysis of On-Chip Impedance Spectroscopy Methodologies for Sensor Arrays
Analysis of On-Chip Impedance Spectroscopy Methodologies for Sensor Arrays
复制标题
传感器阵列片上阻抗谱方法分析
DOI：
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发表时间：
2006
期刊：
影响因子：
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通讯作者：
Chao Yang
中科院分区：
文献类型：
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作者：
D. Rairigh;A. Mason;Chao Yang
尽管芯片级、基于阻抗的传感器阵列有大量令人兴奋的应用，但几乎没有片上仪器电路支持这种系统。这一空白阻碍了许多纳米技术传感器的进一步研究，并阻碍了许多相关应用的全部潜力。本文概述了测量传感器阵列复阻抗的仪器电路的关键要求。它分析了三种最有可能填补这一空白的方法：FFT，FRA和最近推出的快速FRA系统。每种方法的片上实现的要求和权衡，并快速FRA方法，以提供最佳的速度和硬件简单性的组合。
Despite the great number of exciting applications for chip-scale, impedance-based sensor arrays, almost no on-chip instrumentation circuitry exists to support such systems. This void is inhibiting further research with many nanotechnology sensors and impeding the full potential of many related applications. This paper outlines the key requirements for instrumentation circuitry to measure the complex impedance of sensor arrays. It analyzes the three most likely approaches for filling this void: FFT, FRA, and a recently introduced rapid FRA system. The requirements and tradeoffs in the on-chip realization of each approach are presented, and the rapid FRA method is shown to provide the best combination of speed and hardware simplicity.