First tests of CHERWELL, a Monolithic Active Pixel Sensor: A CMOS Image Sensor (CIS) using 180nm technology
First tests of CHERWELL, a Monolithic Active Pixel Sensor: A CMOS Image Sensor (CIS) using 180nm technology
复制标题
单片有源像素传感器 CHERWELL 的首次测试：采用 180nm 技术的 CMOS 图像传感器 (CIS)
DOI：
10.1016/j.nima.2013.05.023
复制
发表时间：
2013
期刊：
影响因子：
--
通讯作者：
Mylroie-Smith J
中科院分区：
文献类型：
--
作者：
Mylroie-Smith J
Cherwell是一款采用180纳米技术的4T CMOS传感器，用于检测带电粒子。这里，将描述传感器上的不同测试结构，并首先显示对参考像素变体的测试结果。这些传感器的噪声为12e−，信噪比高达150in 55Fe。
The Cherwell is a 4T CMOS sensor in 180 nm technology developed for the detection of charged particles. Here, the different test structures on the sensor will be described and first results from tests on the reference pixel variant are shown. The sensors were shown to have a noise of 12 e−and a signal to noise up to 150 in55Fe.