Sources Of Noise In High-Resolution Screen-Film Radiography
Sources Of Noise In High-Resolution Screen-Film Radiography
复制标题
高分辨率屏幕胶片放射线照相中的噪声源
DOI：
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发表时间：
1986
期刊：
影响因子：
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通讯作者：
R. Metter
中科院分区：
文献类型：
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作者：
P. Bunch;K. E. Huff;R. Metter
本文测量了高分辨率屏-片组合在30 kVp X射线谱下的对比度传递函数、噪声功率谱、噪声等效量子数和探测量子效率。除了这些总的系统特性之外，在屏-膜组合中的噪声的选定分量源已经通过实验确定。这些数据被解释在一个简单的模型，这是用来预测屏幕电影的成本，NEQ，和DQE。模型预测和实验测量之间的合理协议已被发现。
The contrast transfer function (CTF), noise power spectrum (NPS), noise equivalent quanta (NEQ), and detective quantum efficiency (DQE) of a high-resolution screen-film combination have been measured for exposure to a 30 kVp x-ray spectrum. In addition to these overall system characteristics, selected component sources of noise in the screen-film combination have been determined experimentally. These data are interpreted in terms of a simple model which is used to predict screen-film NPS, NEQ, and DQE. Reasonable agreement between model predictions and experimental measurements has been found.
射线照相屏幕胶片系统中特征 X 射线发射和重吸收位置之间空间相关性的维纳光谱效应。
影响因子：
3.5
作者：
Metz,CE;Vyborny,CJ
通讯作者：
Vyborny,CJ