DFSSD: Deep Faults and Shallow State Duality, A Provably Strong Obfuscation Solution for Circuits with Restricted Access to Scan Chain
DFSSD: Deep Faults and Shallow State Duality, A Provably Strong Obfuscation Solution for Circuits with Restricted Access to Scan Chain
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DOI：
10.1109/vts48691.2020.9107629
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发表时间：
2020-02
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通讯作者：
Shervin Roshanisefat;Hadi Mardani Kamali;K. Z. Azar;Sai Manoj Pudukotai Dinakarrao;Naghmeh Karimi;H. Homayoun;Avesta Sasan
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文献类型：
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作者：
Shervin Roshanisefat;Hadi Mardani Kamali;K. Z. Azar;Sai Manoj Pudukotai Dinakarrao;Naghmeh Karimi;H. Homayoun;Avesta Sasan
在本文中，我们介绍了DFSSD，一种新的逻辑锁定解决方案，用于顺序和FSM电路，具有对扫描链的限制（锁定）访问。DFSSD结合了两种混淆技术：(1)深断层，(2)浅状态对偶。这两种技术都是专门设计来抵抗基于有界模型检查的连续SAT攻击的。浅状态对偶性防止连续的SAT攻击在不运行详尽的无界模型检查器来评估攻击是否可以终止的情况下采取早期终止的捷径。另一方面，深层故障为设计人员提供了一种技术，用于构建深层但关键的可恢复故障，这些故障无法在合理的时间内被连续的SAT（和基于有界模型检查器的）攻击发现。
In this paper, we introduce DFSSD, a novel logic locking solution for sequential and FSM circuits with a restricted (locked) access to the scan chain. DFSSD combines two techniques for obfuscation: (1) Deep Faults, and (2) Shallow State Duality. Both techniques are specifically designed to resist against sequential SAT attacks based on bounded model checking. The shallow state duality prevents a sequential SAT attack from taking a shortcut for early termination without running an exhaustive unbounded model checker to assess if the attack could be terminated. The deep fault, on the other hand, provides a designer with a technique for building deep, yet key recoverable faults that could not be discovered by sequential SAT (and bounded model checker based) attacks in a reasonable time.