Probabilistic error detection and correction in switched capacitor circuits using checksum codes
Probabilistic error detection and correction in switched capacitor circuits using checksum codes
复制标题
使用校验和代码进行开关电容器电路中的概率错误检测和校正
DOI:
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发表时间:
2017
期刊:
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通讯作者:
A. Chatterjee
中科院分区:
文献类型:
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作者:
Md Imran Momtaz;Suvadeep Banerjee;A. Chatterjee
In the past, techniques for error detection in linear digital and analog circuits using checksum codes have been developed and shown to be highly efficient. While error detection is a solved problem, error correction has proved to be difficult due to the time and area overheads involved in diagnosing failed system states and correcting them in real-time. To solve the correction problem, real-time probabilistic correction mechanisms have been proposed for digital circuits that correct for state errors in a probabilistic manner, circumventing the process of accurate error diagnosis. Such a technique is difficult to apply to continuous-time analog circuits without altering the analog transfer function, due to the nature of error feedback mechanisms involved. However, switched-capacitor circuits offer intrinsic advantages; they replicate analog continuous-time behavior while retaining the benefits of a digital clock. In this work, we show how errors in switched-capacitor circuits can be detected and corrected, using probabilistic correction algorithms, by taking advantage of the separation in time afforded by the use of a digital clock between error-free and error-affected clock cycles of the circuit. By probabilistically correcting errors in real-time before the onset of future clock cycles, the advantages offered by digital clocks are exploited to deliver high-fidelity analog performance in switched-capacitor filters resulting in significant SNR benefits at low cost.