Heterogeneous clusters as a model system for the study of ionization dynamics within tampered samples

Heterogeneous clusters as a model system for the study of ionization dynamics within tampered samples
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DOI:
10.1103/physreva.84.033201
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发表时间:
2011-09
期刊:
影响因子:
2.9
通讯作者:
B. Ziaja;H. Chapman;R. Santra;T. Laarmann;E. Weckert;C. Bostedt;T. Möller
B. Ziaja;H. Chapman;R. Santra;T. Laarmann;E. Weckert;C. Bostedt;T. Möller
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
B. Ziaja;H. Chapman;R. Santra;T. Laarmann;E. Weckert;C. Bostedt;T. Möller

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用另一种材料层篡改样品是一种有前途的技术,可以减缓激光照射样品内的膨胀动力学,对单粒子衍射成像具有良好的影响。理想情况下,如果成像的物体被另一种材料的层覆盖,则在照射期间,该层将主要被电离并且由于库仑排斥而快速膨胀,而位于净中性核内的物体将膨胀得更慢(流体动力学地)。我们调查的电子损伤的细节篡改的样品在他们的照射与强烈的极紫外(EUV)脉冲。我们研究了由惰性气体原子,氘和Ar组成的异质团簇,化学键效应可以忽略不计。使用完全非平衡动力学方程代码,我们演示了团簇组成对电离动力学的影响;特别是对电子损伤的影响。获得的结果为32 nm的波长,这是在自由电子激光器在汉堡(FLASH)设施,但我们的结论也可以有一个更复杂的结构和照射在一个更短的波长的样品的影响。
Tampering of a sample with a layer of another material is a promising technique to slow down the expansion dynamics within laser irradiated samples, with sound implications for single-particle diffraction imaging. Ideally, if an imaged object is covered by a layer of another material, during the irradiation this layer will be primarily ionized and will expand fast due to Coulomb repulsion, whereas the object located within the net neutral core will expand more slowly (hydrodynamically). We investigate the details of the electronic damage within the tampered samples during their irradiation with an intense extreme ultraviolet (EUV) pulse. We study heterogeneous clusters composed of noble gas atoms, Xe and Ar, for which chemical-bond effects can be neglected. Using a fully nonequilibrium kinetic equation code, we demonstrate the influence of cluster composition on ionization dynamics; in particular, on the electronic damage. The results are obtained for the wavelength of 32 nm, which is available at the free-electron laser in Hamburg (FLASH) facility, but our conclusions can also have implications for samples with a more complex structure and irradiated at a much shorter wavelength.