Correlation between hydrogen isotope profiles and surface structure of divertor tiles in JT-60U
Correlation between hydrogen isotope profiles and surface structure of divertor tiles in JT-60U
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JT-60U中偏滤器瓦表面结构与氢同位素分布的相关性
DOI：
10.1016/j.jnucmat.2004.04.276
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发表时间：
2004
影响因子：
3.1
通讯作者：
T. Tanabe
中科院分区：
文献类型：
--
作者：
Y. Morimoto;Y. Oya;Y. Hirohata;H. Kodama;H. Yoshida;K. Kizu;J. Yagyu;K. Masaki;Y. Gotoh;N. Miya;K. Okuno;T. Tanabe
本文用二次离子质谱（西姆斯）研究了JT-60 U整流罩单元区氢/氘的深度分布。该信息与表面特征相关，特别是从侵蚀和沉积方面，通过扫描电子显微镜（SEM）和X射线光电子能谱（XPS）确定。朝向偏滤器的外表面大部分被最大10 μm厚的再沉积层覆盖，而朝向偏滤器的内表面则被侵蚀。这一沉积剖面与大多数托卡马克装置偏滤器区域的观测结果相反，偏滤器外侧被腐蚀，内侧被沉积。然而，H+D保留率是较高的沉积层比侵蚀区。然而，氢保留似乎很小，并没有表现出明显的影响，XPS的C1 s谱相比，组成元素硼和氧。
The present paper is devoted to depth profiles by secondary ion mass spectroscopy (SIMS) of hydrogen/deuterium in tiles taken from the dome unit area of JT-60U. This information is correlated with surface features, particularly from the aspect of erosion and deposition, determined by scanning electron microscope (SEM) and X-ray photoelectron spectroscopy (XPS). The outer divertor-facing surface was mostly covered by re-deposited layers a maximum of 10 μm thick, while the inner divertor-facing side was eroded. The deposition profile is opposite to the observation for the divertor area in most tokamaks that the outer divertor side is eroded, while the inner deposited. However, H+D retention was higher for the deposited layers than that for the eroded area. Nevertheless, hydrogen retention seems very small and showed no appreciable effects on C1s spectra of XPS compared to the constituent elements boron and oxygen.
JT-60U石墨瓦中的氚保留量
DOI：
--
发表时间：
2010
期刊：
影响因子：
--
作者：
真野昌二;山田(後藤)志野;坂本旦;M.Yoshida
通讯作者：
M.Yoshida