Strong (CII) emission at high redshift

Strong (CII) emission at high redshift
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DOI:
10.1051/0004-6361/200912265
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发表时间:
2009-04
影响因子:
6.5
通讯作者:
R. Maiolino;P. Caselli;T. Nagao;M. Walmsley;C. Breuck;M. Meneghetti
R. Maiolino;P. Caselli;T. Nagao;M. Walmsley;C. Breuck;M. Meneghetti
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
R. Maiolino;P. Caselli;T. Nagao;M. Walmsley;C. Breuck;M. Meneghetti

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本文报道了用APEX望远镜在透镜星系BRI 0952-0115中观测到z = 4.43的[CII ] 157.74 μm精细结构谱线。这是首次在高红移LFIR <1013 LO的光源中探测到[CII]线。该线在高z下比以前的[CII]检测强得多(通量高5-8倍),部分原因是透镜放大。L [CII] / FIR比为10- 2。9,比在具有类似红外光度的本地星系中观察到的要高。结合之前在高红移下对[CII]的观测,我们的结果表明,高红移星系中的[CII]发射相对于具有相同红外光度的本星系是增强的。这一发现可能是由于当前在高红移下对[CII]的少数观测的选择效应,特别是可能尚未发表的未探测结果(尽管少数已发表的上限仍然与[CII]增强情景一致)。如果这一趋势在更大的样本中得到证实,这将表明高z星系的物理条件与其本地对应星系不同。无论这种趋势的物理起源如何,这种效应都将增加[CII]158 μm谱线搜索和表征高z源的潜力。
We report the detection of the [CII ] 157.74 μm fine-structure line in the lensed galaxy BRI 0952-0115 at z = 4.43, using the APEX telescope. This is the first detection of the [CII] line in a source with L FIR < 10 13 L o at high redshift. The line is much stronger than previous [CII] detections at high-z (a factor of 5-8 higher in flux), partly due to the lensing amplification. The L [CII] / FIR ratio is 10- 2 . 9 , which is higher than observed in local galaxies with similar infrared luminosities. Together with previous observations of [CII] at high redshift, our result suggests that the [CII] emission in high-redshift galaxies is enhanced relative to local galaxies with the same infrared luminosity. This finding may result from selection effects of the few current observations of [CII] at high redshift and, in particular, from non detections that may not have been published (although the few published upper limits are still consistent with the [CII] enhancement scenario). If the trend is confirmed with larger samples, it would indicate that high-z galaxies are characterized by different physical conditions than for their local counterparts. Regardless of the physical origin of the trend, this effect would increase the potential of the [CII]158 μm line to search and characterize high-z sources.