The conductivity of thin metallic films according to the electron theory of metals
The conductivity of thin metallic films according to the electron theory of metals
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DOI：
10.1017/s0305004100019952
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发表时间：
1938-01-01
影响因子：
--
通讯作者：
Fuchs, K
中科院分区：
文献类型：
--
作者：
Fuchs, K
最近在布里斯托尔的H. W. Wills物理实验室*测量了碱金属薄膜的导电性。研究发现，当薄膜的厚度减小到几个原子层的厚度时，电导率下降到低于体金属的电导率。在引用的论文中提出了这样的假设，即这种效应是由于金属的传导电子与薄膜边界的碰撞缩短了平均自由程。将实验结果与基于该假设推导出的公式进行了比较。然而，这个公式是在许多简化的假设下得到的，得到一个更精确的公式是本文的首要目的。并将公式与实验进行了比较，对薄膜表面进行了一定的推导。
The conductivity of thin films of the alkali metals has recently been measured in the H. W. Wills Physical Laboratory, Bristol*. It was found that as the thickness of the film is decreased to that of a few atomic layers the conductivity drops below that of the bulk metal. In the papers quoted the hypothesis was put forward that this effect is due to the shortening of the mean free paths of the conduction electrons of the metal by collisions with the boundaries of the film. The experimental results were compared with a formula derived on the basis of this hypothesis. This formula was, however, obtained subject to a number of simplifying assumptions, and it is the first purpose of this paper to obtain a more accurate formula. I also compare this formula with experiment, and make certain deductions about the surfaces of thin films.