Piezoelectric Response of Relaxor Solid Solution Na_<0.5>Bi_<0.5>TiO_3-BaTiO_3 Single Crystal Grown by Bridgman Method

Piezoelectric Response of Relaxor Solid Solution Na_<0.5>Bi_<0.5>TiO_3-BaTiO_3 Single Crystal Grown by Bridgman Method
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布里奇曼法生长弛豫固溶体Na_<0.5>Bi_<0.5>TiO_3-BaTiO_3单晶的压电响应

DOI:
10.1080/00150193.2011.577373
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发表时间:
2011
期刊:
影响因子:
0.8
通讯作者:
Yoshihiro Ishibashi
Yoshihiro Ishibashi
中科院分区:
材料科学4区
文献类型:
--
作者:
Naohiko Yasuda;Shouta Otsuka;Hidehiro Ohwa;Kazuhiko Fujita;Makoto Iwata;Hikaru Terauchi;Yoshihiro Ishibashi

文献摘要

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宏观观察显示 Na0.5Bi0.5TiO3(NBT)-BaTiO3(Ba;0.33%) 菱形 (001) 板中没有域切换,而使用压电响应力显微镜 (PFM) 进行的微观观察则揭示了两种压电响应图像,一种具有域切换,另一种没有域切换。磁畴切换的这种微观显着差异取决于反向极化磁畴的局部成核引起的矫顽场。从基于 Bi 离子和氧空位引起的晶格缺陷的随机场产生的弛豫态的角度讨论了这种矫顽场。
While macroscopic observation reveals non-switching of domain in Na0.5Bi0.5TiO3(NBT)-BaTiO3(Ba;0.33%) rhombohedral (001) plate, microscopic observation, using the piezoresponse force microscopy (PFM), reveals two kinds of piezoresponse images, one with domain switching and the other without one. Such microscopic remarkable difference of domain switching depends on the coercive field caused by localized nucleation of domains with reversed polarization. Such coercive fields was discussed from the viewpoint of the relaxor states resulting from random fields based on lattice defects due to Bi ions and oxygen vacancies.