Feature-specific imaging
Feature-specific imaging
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DOI：
10.1364/ao.42.003379
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发表时间：
2003-06-10
期刊：
影响因子：
1.9
通讯作者：
Shankar, P
中科院分区：
文献类型：
--
作者：
Neifeld, MA;Shankar, P
我们分析了特定功能成像系统的性能。我们研究非相干光学系统，直接测量的光学辐照度分布的线性项目。直接特征测量利用了多路复用的优势，并且对于少量的投影，可以提供比那些对传统图像进行后处理的系统更高的特征保真度。我们使用小波，Karlumen-Loeve（KL），Hadamard和独立分量特征，在高斯，拍摄和量化噪声环境中量化特征保真度来检查特定于特征的成像。基于KL投影的特征特定成像的一个例子进行了分析，并表明在高噪声环境中，它是可以通过直接特征测量来提高图像保真度。提出了一种候选光学系统，并进行了初步的实施研究。(C)2003年美国光学学会。
We analyze the performance of feature-specific imaging systems. We study incoherent optical systems that directly measure linear projects of the optical irradiance distribution. Direct feature measurement exploits the multiplex advantage, and for small numbers of projections can provide higher feature-fidelity than those systems that postprocess a conventional image. We examine feature-specific imaging using Wavelet, Karlumen-Loeve (KL), Hadamard, and independent-component features, quantifying feature fidelity in Gaussian-, shot-, and quantization-noise environments. An example of feature-specific imaging based on KL projections is analyzed and demonstrates that within a high-noise environment it is possible to improve image fidelity via direct feature measurement. A candidate optical system is presented and a preliminary implementational study is undertaken. (C) 2003 Optical Society of America.