Thermal Radiation Spectroscopy Diagnosis for Temperature and Microstructure of Surfaces
Thermal Radiation Spectroscopy Diagnosis for Temperature and Microstructure of Surfaces
复制标题
表面温度和微观结构的热辐射光谱诊断
DOI：
10.1299/jsmeb.46.500
复制
发表时间：
2003
期刊：
影响因子：
--
通讯作者：
Hidenobu Wakabayashi
中科院分区：
文献类型：
--
作者：
T. Makino;Hidenobu Wakabayashi
固体材料真实的表面微观状态在工业环境中发生变化，或者在工业表面处理过程中发生正向变化。为了实现过程控制，需要发展表面微观状态的真实的实时诊断技术。本文提出了一种基于宽光谱范围高速分光光度计系统硬件性能的真实的表面温度和微观结构诊断技术。对于温度，采用了主动光谱高温计技术，其中测量表面的反射以及自发射。在微观结构方面，注意到辐射在一个新的真实的表面模型中的干涉和衍射。在金属表面进行了高温氧化实验，以验证该技术的性能。每隔2s测量近红外至红外区域的辐射的发射和反射能量的光谱，并进行分析。在10 K的误差范围内估计了1100 K量级的表面温度的时间跃迁。表面膜的平均厚度d和均方根粗糙度σI估计分别在d=0.08 μm和σI=0.01 μ m ~ 0.71μm的范围内。
Surface microstates of real surfaces of solid materials change in industrial environments, or they are changed in industrial surface processes positively. A real time diagnosis technique for the surface microstates should be developed for the process control. We propose a diagnosis technique for temperature and microstructure of real surfaces on a basis of the hardware performance of our wide-spectral-range high-speed spectrophotometer system. With respect to the temperature, an active spectral pyrometer technique is adopted, in which the reflection of the surface is measured as well as the self-emission. With respect to the microstructure, an attention is paid to the interference and diffraction of radiation in a new real surface model. An experiment is made on a metal surface in a high-temperature oxidation process to verify the performance of this technique. Spectra of emission and reflection energy of radiation in a near-infrared through infrared region are measured at every 2s, and analyzed. Time transition of the surface temperature of an order of 1100K is estimated within an inaccuracy of 10K. The average thickness d and rms roughness σI of the surface film are estimated to be in regions of d=0.08∼3.8µm and σI=0.01∼0.71µm, respectively.
DOI：
--
发表时间：
2007
期刊：
影响因子：
--
作者：
A.I.Volokitin;B.N.J.Perssion;H.Ueba;H. Ueba;H. Ueba;H. Ueba
通讯作者：
H. Ueba